Picture of Spectrometer EDX - IXRF
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The IXRF's energy dispersive X-ray spectroscopy ( EDX ) unit is connected with the tool #116 ( Zeiss SUPRA SEM ) and is equipped with high resolution SD detector and can be used for the elemental analysis and characterisation of a sample material. Resolution: 133eV

Tool name:
Spectrometer EDX - IXRF
Area/room:
Processlab 1
Category:
Metrology
Manufacturer:
IXRF
Model:
-
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hours
Max booking time, night:
hours
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