Picture of Wafer Inspection System - IR
Current status:
AVAILABLE
Book | Log
Show/Collapse all

You must be logged in to view files.

IR Wafer inspection system, intended for bonded wafers/substrates

Tool name:
Wafer Inspection System - IR
Area/room:
Processlab 1
Category:
Metrology
Manufacturer:
-
Model:
-
Max booking time, day:
4 hours
Max booking time, night:
4 hours
No. of future bookings:
5

Instructors

Licensed Users

You must be logged in to view tool modes.